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Nanometrology Using the Transmission Electron Microscope

Vlad Stolojan

Description

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

About Editors

Vlad Stolojan is a Lecturer in nanomaterials characterization, working in the Advanced Technology Institute at the University of Surrey. He joined the Nano-Electronics Centre at Surrey in 2001 as an expert in electron microscopy and energy-loss spectroscopy. He is the author of more than 80 peer-reviewed publications, is the member of the Institute of Physics and a fellow of the Royal Microscopical Society.

Table of Contents

Table of Contents: Introduction / The Transmission Electron Microscope / Imaging / Resolution / Image Calibration / Sample Orientation / Modes of Imaging and Diffraction / Spectroscopy / Energy-dispersive X-ray Spectroscopy (EDX) / Electron Energy Loss Spectroscopy (EELS)

Bibliographic

Paperback ISBN: 9780750327992

Ebook ISBN: 9781681741840

DOI: 10.1088/978-1-6817-4120-8

Publisher: Morgan & Claypool Publishers

Series: Series in Micro- and Nano-metrology

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