Nanometrology Using the Transmission Electron Microscope
- Vlad Stolojan
- October 2015
DescriptionThe Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
About EditorsVlad Stolojan is a Lecturer in nanomaterials characterization, working in the Advanced Technology Institute at the University of Surrey. He joined the Nano-Electronics Centre at Surrey in 2001 as an expert in electron microscopy and energy-loss spectroscopy. He is the author of more than 80 peer-reviewed publications, is the member of the Institute of Physics and a fellow of the Royal Microscopical Society.
Table of ContentsTable of Contents: Introduction / The Transmission Electron Microscope / Imaging / Resolution / Image Calibration / Sample Orientation / Modes of Imaging and Diffraction / Spectroscopy / Energy-dispersive X-ray Spectroscopy (EDX) / Electron Energy Loss Spectroscopy (EELS)
Paperback ISBN: 9780750327992
Ebook ISBN: 9781681741840
Publisher: Morgan & Claypool Publishers