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Modern Interferometry for Length Metrology

Exploring limits and novel techniques
Professor René Schödel


Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length metrology.

About Editors

René Schӧdel is the head of the Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB), and is highly engaged in fields of optical interferometry and length metrology. Other contributors to the work are Florian Pollinger, Arnold Nicolaus, Guido Bartl, Thilo Schuldt, Nandini Bhattacharya, Steven van den Berg, Seung-Woo Kim, Yoon-Soo Jang, Armin Reichhold, Birk Andreas and Christoph Weichert.

Table of Contents

Chapter 1 - Practical realization of the length by interferometry - General principles and


Chapter 2 - Large field imaging interferometry for the measurement of the length of bar

shaped material measures

Chapter 3 - Fizeau Interferometry for the sub-nm accurate realization of sphere radii

Chapter 4 - Interferometry for distance metrology in space

Chapter 5 - Interferometry in air with refractive index compensation

Chapter 6 - Frequency-comb-based spectral interferometry and homodyne many-wavelength interferometry for distance measurements

Chapter 7 - Absolute distance measurement based on dispersive/spectral domain

interferometry and dual comb interferometry

Chapter 8 - Frequency- scanning interferometry-based distance metrology

Chapter 9 - pm-level distance interferometry


Hardback ISBN: 9780750315760

Ebook ISBN: 9780750315784

DOI: 10.1088/2053-2563/aadddc

Publisher: Institute of Physics Publishing


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